Contrast within images of locally charged dielectrics in scanning electron microscopy-Reference-Cited by-同舟云学术

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Contrast within images of locally charged dielectrics in scanning electron microscopy

Published:2012-11 Issue:6 Volume:6 Page:911-917
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Rau E. I.,Tatarintsev A. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451012110080.pdf

Reference21 articles.

1. I. M. Bronshtein and B. S. Fraiman, Secondary Electron Emission (Nauka, Moscow, 1969) [in Russian].

2. H. Seiler, J. Appl. Phys. 54, R1 (1983).

3. L. Reimer, U. Golla, R. Bongeler, et al., Optik (Stuttgart) 92, 14 (1992).

4. L. Frank, M. Zadrazil, and I. Mullerova, Microchim. Acta 13, 289 (1996).

5. D. C. Joy and C. S. Joy, Micron 27, 247 (1996).

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