1. D. Brouns, Adv. Opt. Technol. 6, 221 (2017). https://www.doi.org/10.1515/aot-2017-0023
2. M. van de Kerkhof, H. Jasper, L. Levasier, R. Peeters, R. van Es, J.-W. Bosker, A. Zdravkov, E. Lenderink, F. Evangelista, P. Broman, B. Bilski, and T. Last, Proc. SPIE 10143, 101430D (2017).
https://www.doi.org/10.1117/12.2258025
3. M. M. Barysheva, S. Yu. Zuev, A. Ya. Lopatin, V. I. Luchin, A. E. Pestov, N. N. Salashchenko, N. N. Tsybin, and N. I. Chkhalo, Tech. Phys. 65, 1726 (2020). https://doi.org/10.1134/S1063784220110043
4. N. N. Salashchenko and N. I. Chkhalo, Proc. School of Young Scientists “Modern X-Ray Optics 2022” (Nizhny Novgorod, 2022), p. 72. http://modern.xray-optics.ru.
5. H. I. Smith, J. Vac. Sci. Technol., B 14, 4318 (1996). https://www.doi.org/10.1116/1.589044