Comparative analysis of long-range effect using RBS technique and microhardness measurements-Reference-Cited by-同舟云学术

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Comparative analysis of long-range effect using RBS technique and microhardness measurements

Published:2010-04 Issue:2 Volume:4 Page:350-352
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Levshunova V. L.,Pokhil G. P.,Tetel’baum D. l.,Chernykh P. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S102745101002031X.pdf

Reference9 articles.

1. D. I. Tetel’baum, A. A. Trofimov, A. Yu. Azov, et al., Pis’ma Zh. Tekh. Fiz. 24(23), 9 (1998) [Tech. Phys. Lett. 24, 910 (1998)].

2. D. I. Tetelbaum, A. Yu. Azov, E. V. Kuril’chik, et al., Vacuum 70(2–3), 169 (2003).

3. D. I. Tetel’baum, A. Yu. Azov, and P. I. Golyakov, Pis’ma Zh. Tekh. Fiz. 29(2), 35 (2003) [Tech. Phys. Lett. 29, 57 (2003)].

4. D. I. Tetel’baum, E. V. Kuril’chik, A. Yu. Azov, et al., Poverkhnost’, No. 4, 67 (2003).

5. D. I. Tetel’baum, Yu. A. Mendeleva, and A. Yu. Azov, Pis’ma Zh. Tekh. Fiz. 30(11), 65 (2004) [Tech. Phys. Lett. 30, 471 (2004)].

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