Influence of ion bombardment on the profile of the depth distribution of impurity atoms in Si used for solar cells and diode structures-Reference-Cited by-同舟云学术

Influence of ion bombardment on the profile of the depth distribution of impurity atoms in Si used for solar cells and diode structures

Published:2014-09 Issue:5 Volume:8 Page:937-940
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Umirzakov B. E.,Nimatov S. J.,Boltaev H. H.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451014030355.pdf

Reference8 articles.

1. J. Zhao, A. Wang, M. A. Green, and F. Ferraza, Appl. Phys. Lett. 73, 1991 (1998).

2. J. Zhao, M. A. Green, and A. Wang, J. Appl. Phys. 92, 2977 (2002).

3. A. V. Karimov and D. M. Edgorova, Physical Phenomena in GaAs Structures with Microlayer Quasiperiodical Transition (FAN, Tashkent, 2005) [in Russian].

4. O. V. Aleksandrov and E. N. Mokhov, Semiconductors 45, 705 (2011).

5. D. A. Tashmukhamedova, B. E. Umirzakov, and M. A. Mirzhalilova, Izv. Akad. Nauk, Ser. Fiz. 68, 424 (2004).

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