Fast and Accurate Deep Learning Model for Stamps Detection for Embedded Devices-Reference-Cited by-同舟云学术

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Fast and Accurate Deep Learning Model for Stamps Detection for Embedded Devices

Published:2022-12 Issue:4 Volume:32 Page:772-779
ISSN:1054-6618
Container-title:Pattern Recognition and Image Analysis
language:en
Short-container-title:Pattern Recognit. Image Anal.

Author:

Gayer A.,Ershova D.,Arlazarov V.

Publisher

Pleiades Publishing Ltd

Subject

Computer Vision and Pattern Recognition

Link

https://link.springer.com/content/pdf/10.1134/S1054661822040046.pdf

Reference30 articles.

1. M. Afifi, Ya. Ali, K. Amer, M. Shaker, and M. Elhelw, “Robust real-time pedestrian detection on embedded devices,” Proc. SPIE 11605, 1160529 (2021). https://doi.org/10.1117/12.2587097

2. S. Ahmed, F. Shafait, M. Liwicki and A. Dengel, “A generic method for stamp segmentation using part-based features,” in 12th Int. Conf. on Document Analysis and Recognition, Washington, D.C., 2013 (IEEE, 2013), pp. 708–712. https://doi.org/10.1109/ICDAR.2013.145

3. N. A. Andriyanov, V. E. Dementiev, and A. G. Tashlinskii, “Detection of objects in the images: from likelihood relationships towards scalable and efficient neural networks,” Komp’yut. Opt. 46, 139–159 (2022). https://doi.org/10.18287/2412-6179-CO-922

4. A. Alireza, R. P. Partha, and P. Umapada, “Logo and seal based administrative document image retrieval: A survey,” Comput. Sci. Rev. 22, 47–63 (2016). https://doi.org/10.1016/j.cosrev.2016.09.002

5. V. V. Arlazarov, J. S. Voysyat, D. P. Matalov, D. P. Nikolaev, and S. A. Usilin, “Evolution of the Viola–Jones object detection method: A survey,” Vestn. Yuzhno-Ural. Gos. Univ. Ser. Mat. Model. Progr. 14 (4), 5–23 (2021). https://doi.org/10.14529/mmp210401

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of a Detector for Stamps on Images;2024 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM);2024-05-20

2. High-Performance Digital Image Processing;Pattern Recognition and Image Analysis;2023-12

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