Statistical analysis of AFM topographic images of self-assembled quantum dots-Reference-Cited by-同舟云学术

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Statistical analysis of AFM topographic images of self-assembled quantum dots

Published:2013-07 Issue:7 Volume:47 Page:930-934
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Sevriuk V. A.,Brunkov P. N.,Shalnev I. V.,Gutkin A. A.,Klimko G. V.,Gronin S. V.,Sorokin S. V.,Konnikov S. G.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S106378261307021X.pdf

Reference15 articles.

1. N. N. Ledentsov, V. M. Ustinov, V. A. Shchukin, P. S. Kop’ev, Zh. I. Alferov, and D. Bimberg, Semiconductors 32, 343 (1998).

2. D. Bimberg, M. Grundmann, and N. N. Ledentsov, Quantum Dot Heterostructures (Wiley, Chichester, 1998).

3. Lecture Notes in Nanoscale Science and Technology,2008

4. Lecture Notes in Nanoscale Science and Technology,2012

5. http://www.brukerafmprobes.com/ ; http://www.ntmdttips.com/

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