Study of the correlation parameters of the surface structure of disordered semiconductors by the two-dimensional DFA and average mutual information methods-Reference-Cited by-同舟云学术

Study of the correlation parameters of the surface structure of disordered semiconductors by the two-dimensional DFA and average mutual information methods

Published:2015-04 Issue:4 Volume:49 Page:456-460
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Alpatov A. V.,Vikhrov S. P.,Rybina N. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S106378261504003X.pdf

Reference7 articles.

1. V. A. Karasev and V. V. Luchinin, Introduction to the Design of Bionic Nanosystems (Fizmatlit, Moscow, 2011) [in Russian].

2. A. V. Alpatov, S. P. Vikhrov, and N. V. Grishankina, Semiconductors 47, 365 (2013).

3. A. V. Alpatov, S. P. Vikhrov, N. V. Grishankina, and S. M. Mursalov, Vestn. Ryazan. Radiotekh. Univ., No. 4 (42, pt. 2), 12 (2012).

4. T. G. Avacheva, N. V. Bodyagin, S. P. Vikhrov, and S. M. Mursalov, Semiconductors 42, 499 (2008).

5. F. Takens, Lectures Notes in Mathematics (Springer, New York, 1981).

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