1. A. Roeseler, Infrared Spectroscopic Ellipsometry (Akademic, Berlin, 1990).
2. Z. W. Kowalski, Electron. Technol. 31(3/4), 477 (1998).
3. A. V. Sokolov, Optical Properties of Metals (Fizmatgiz, Moscow, 1961; Elsevier, New York, 1967).
4. Fundamentals of Ellipsometry, Ed. by A. V. Rzhanov (Nauka, Novosibirsk, 1979) [in Russian].
5. A. Roeseler, Thin Solid Films 234, 307 (1993).