Polarization Tomography of Residual Stresses in Cylindrical Gradient-Index Lenses-Reference-Cited by-同舟云学术

Polarization Tomography of Residual Stresses in Cylindrical Gradient-Index Lenses

Published:2018-05 Issue:5 Volume:124 Page:735-740
ISSN:0030-400X
Container-title:Optics and Spectroscopy
language:en
Short-container-title:Opt. Spectrosc.

Author:

Puro A. E.,Karov D. D.

Publisher

Pleiades Publishing Ltd

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S0030400X1805017X.pdf

Reference28 articles.

1. P. L. Chu, Electron. Lett. 24, 736 (1977).

2. L. Pagnotta and A. Poggialini, Soc. Exp. Mech. 43, 69 (2003).

3. D. D. Karov, B. V. Makushkin, S. P. Sivko, S. N. Ushakov, and A. B. Fadeev, in Proceedings of the 4th All-Union Symposium on Computational Tomography, Tashkent, 1989 (Inst. Mat. SO AN SSSR, Novosibirsk, 1989), p. 202.

4. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1968).

5. D. D. Karov, Extended Abstract of Cand. Sci. Dissertation (SPb State Polytech. Univ., St. Petersburg, 2012). https://doi.org/fizmathim.com/read/369384/a?#?page=16.

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tensor tomography of the residual stress field in graded-index YAG’s single crystals;Journal of Inverse and Ill-posed Problems;2023-08-25

2. CURVED-RAY TENSOR TOMOGRAPHY FOR RESIDUAL STRESS MEASUREMENTS IN THE AXISYMMETRIC GRADED RODS;ST PETER POLY U J-PH;2020

3. Polarization-optical tomography of mechanical stresses in dielectric cylindrical structures of hexagonal single crystal;PROCEEDINGS OF THE XV INTERNATIONAL CONFERENCE «PHYSICS OF DIELECTRICS»;2020

4. Optical tomography of residual stresses in GRIN rod lenses with transverse and longitudinal translucence;Journal of Physics: Conference Series;2019-06-01

5. Calculation and Statistical Experiment on the Monte Carlo Method when Assessing the Stability of the Technical Characteristics of the Automobile Generator Set in Mass Production;2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus);2019-01