1. T. Kawakubo et al., “Fast Data Acquisition System of a Non-Destructive Profile Monitor for a Synchrotron Beam by Using a Microchannel Plate with Multi-Anodes,” Nucl. Instrum. Meth. A. 302, 397–405 (1991).
2. U. Meyer et al., “A Beam Profile Monitor for SIS,” in Proceedings of the 2nd Europ. Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, Travemunde, Germany, 1995, pp. 93–95.
3. D. Shapira, T. A. Lewis, and J. L. Mosher, “A Three Dimensional Beam Profile Monitor Based on Residual and Trace Gas Ionization,” Nucl. Instrum. Meth. A 400, 185–194 (1997).
4. A. N. Artemiev and L. I. Ioudin, et al., “Development of Ionization Detectors for Measuring the Main Parameters of Accelerated Ionizing Beams,” in Proceedings of the 5-th Europ. Part. Accel. Conf. (EPAC-96), Barcelona, Spain, 1996, Vol. 2, pp. 1716–1718.
5. K. Hedblom and L. Hermansson, “Measurement on Transverse Cooling Times and Beam Profile in CELSIUS,” Nucl. Instrum. Meth. A 391, 37–41 (1997).