Prediction of Potential Barrier at Crystallite Boundaries in Poly- and Nanocrystalline Semiconductors-Reference-Cited by-同舟云学术

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Prediction of Potential Barrier at Crystallite Boundaries in Poly- and Nanocrystalline Semiconductors

Published:2019-12 Issue:8 Volume:48 Page:576-581
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Ilin A. S.,Gololobov V. M.,Forsh E. A.,Forsh P. A.,Kashkarov P. K.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739719080067.pdf

Reference30 articles.

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2. Kirillin, M.Y., Sergeeva, E.A., Agrba, P.D., Krainov, A.D., Ezhov, A.A., Shuleiko, D.V., Kashkarov, P.K., and Zabotnov, S.V., Laser-ablated silicon nanoparticles: optical properties and perspectives in optical coherence tomography, Laser Phys., 2015, vol. 25, p. 75604. https://doi.org/10.1088/1054-660X/25/7/075604

3. Polster, S., Jank, M.P.M., and Frey, L., Correlation of film morphology and defect content with the charge-carrier transport in thin-film transistors based on ZnO nanoparticles, J. Appl. Phys., 2016, vol. 119, p. 024504. https://doi.org/10.1063/1.4939289

4. Kashaev, F.V., Kaminskaya, T.P., Zabotnov, S.V., and Golovan, L.A., Structural properties of silicon nanoparticles obtained via femtosecond laser ablation in gases at different pressures, Opt. Quantum Electron., 2016, vol. 48, p. 348. https://doi.org/10.1007/s11082-016-0617-8

5. Korotcenkov, G., Brinzari, V., and Cho, B.K., In2O3- and SnO2-based thin film ozone sensors: fundamentals, J. Sensors, 2016, p. 3816094. https://doi.org/10.1155/2016/3816094

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