Author:
Chumakov A. I.,Sogoyan A. V.,Yanenko A. V.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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2. Radiatsionnaya stoikost’ izdelii EKB (Radiation Hardness of Microelectronic Devices), Chumakov, A.I., Ed., Moscow: NIYaU MIFI, 2015.
3. Chumakov, A.I., Possibilities and limitations of focused laser technique application for SEE sensitivity parameters estimation, Bezopasn. Inform. Tekhnol., 2019, vol. 26, no. 3, pp. 58–67.
4. Mavritskii, O.B., Chumakov, A.I., Egorov, A.N., Pechenkin, A.A., and Nikiforov, A.Yu., Laser equipment for hardness evaluation of semiconductor elements exposed to heavy charged particles (review), Instrum. Exp. Tech., 2016, vol. 59, no. 5, pp. 627–649.
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1. NICA Beamlines and Stations for Applied Research;Physics of Particles and Nuclei Letters;2023-08