Geometric Effects in Current-Voltage Characteristics of a Cross-Shaped MDM Ni/NiO/Fe Structure-Reference-Cited by-同舟云学术

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Geometric Effects in Current-Voltage Characteristics of a Cross-Shaped MDM Ni/NiO/Fe Structure

Published:2018-05 Issue:3 Volume:47 Page:181-186
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Malikov I. V.,Berezin V. A.,Fomin L. A.,Mikhailov G. M.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1134/S1063739718030095/fulltext.html

Reference13 articles.

1. Hobbs, P.C.D., Laibowitz, R.B., and Libsch, F.R., Ni–NiO–Ni tunnel junctions for terahertz and infrared detection, Appl. Opt., 2005, vol. 44, no. 32, pp. 6813–6822.

2. Machel, R.P., Caiken, A., Wang, C.T., and Johnson, L.E., Exchange anisotropy in epitaxial and polycrystalline NiO/NiFe bilayers, Phys. Rev. B, 1998, vol. 58, no. 13, pp. 8566–8573.

3. Fasaki, I., Kotoulaki, A., Kompitsas, M., and Charitidis, C., Structural, electrical and mechanical properties of NiO thin films grown by pulsed laser deposition, Appl. Surf. Sci., 2010, vol. 257, no. 2, pp. 429–433.

4. Courtade, L., Turquat, Ch., Muller, Ch., Lisoni, J.G., Goux, L., Wouters, D.J., Goguenheim, D., Roussel, D., and Ortega, L., Oxidation kinetics of Ni metallic films: formation of NiO-based resistive switching structures, Thin Solid Films, 2008, vol. 516, no. 12, pp. 4083–4092.

5. Gatel, C., Snoeck, E., Serin, V., and Fert, A.R., Epitaxial growth and magnetic exchange anisotropy in Fe3O4/NiO bilayers grown on MgO (001) and Al2O3 (0001), Eur. Phys. J. B, 2005, no. 1, pp. 157–168.

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1. Microstructure and oxidation resistance of relaxed epitaxial nickel thin films grown on (100)- and (110)-SrTiO3 substrates by pulsed laser deposition;CrystEngComm;2018

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