1. J. Kammermaier, G. Rittmayer, and S. Birkle, J. Appl. Phys. 66, 1594 (1989).
2. J. Connoly and M. Dunn, in Proceedings of the IEEE International Conference on Conduction and Breakdown in Solid Dielectrics, Vasteras, Sweden, 1998, pp. 110–113.
3. J. Fothergill, et al., Final Report for EPSRS Grant GR/M74238/01 (2002).
4. M. G. Kong and Y. P. Lee, J. Appl. Phys. 90, 3069 (2001).
5. B. Drugge, H. Fuhrmann, S. Laihonen, and J. Mood, Energize, Aug 2005, pp. 36–40.