Electron-impact excitation of internal atomic layers of a substance in the formation of extended fine structures of electron emission spectra-Reference-Cited by-同舟云学术

Electron-impact excitation of internal atomic layers of a substance in the formation of extended fine structures of electron emission spectra

Published:2011-12 Issue:S1 Volume:52 Page:168-175
ISSN:0022-4766
Container-title:Journal of Structural Chemistry
language:en
Short-container-title:J Struct Chem

Author:

Gai D. E.,Bakieva O. R.,Surnin D. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Inorganic Chemistry,Physical and Theoretical Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S0022476611070225.pdf

Reference14 articles.

1. L. McDonnell, B. D. Powell, and D. P. Woodruff, Sur. Sci., 40, 669–687 (1973).

2. M. DeCrescenzi, A. P. Hitchcock, and T. Tyliszczak, Phys. Rev. B, 39, 9839–9851 (1989).

3. I. Davoli, R. Bernardini, C. Battistoni, et al., Surf. Sci., 309, 144–154 (1994).

4. D. E. Guy, Y. V. Ruts, D. V. Surnin, et al., Physica B, 208/209, 87/88 (1995).

5. Yu. V. Ruts, D. E. Guy, D. V. Surnin, and V. I. Grebennikov, Secondary Electron Fine Structure.-A Method of Local Atomic Structure Characterization. Handbook of Surfaces and Interfaces of Materials, H.S. Nalwa (ed.) (2001), V. 2, Surface and Interface Analysis and Properties, Chapter 14, pp. 191–268.

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