X-ray emission depth-resolved spectroscopy for investigation of nanolayers-Reference-Cited by-同舟云学术

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X-ray emission depth-resolved spectroscopy for investigation of nanolayers

Published:2011-12 Issue:S1 Volume:52 Page:1-12
ISSN:0022-4766
Container-title:Journal of Structural Chemistry
language:en
Short-container-title:J Struct Chem

Author:

Shulakov A. S.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Inorganic Chemistry,Physical and Theoretical Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S0022476611070018.pdf

Reference55 articles.

1. Hadding, Proc. Acad. Science, Stockholm, No. 11 (1922).

2. R. Casteing, PhD Thesis, Univ. Paris (1951).

3. P. Duncumb, PhD Thesis, Cambridge University (1957).

4. N. F. Losev, Quantitative X-ray Spectroscopy Analysis [in Russian], Nauka, Moscow (1969).

5. N. F. Losev and A. N. Smagunova, Basics of X-ray Spectroscopy Fluorescence Analysis [in Russian], Khimiya, Moscow (1982).

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