Frequency dependence of the coercive field and the internal bias field in ferroelectric thin films-Reference-Cited by-同舟云学术

Frequency dependence of the coercive field and the internal bias field in ferroelectric thin films

Published:2009-07 Issue:7 Volume:51 Page:1348-1350
ISSN:1063-7834
Container-title:Physics of the Solid State
language:en
Short-container-title:Phys. Solid State

Author:

Sidorkin A. S.,Nesterenko L. P.,Ryabtsev S. V.,Sidorkin A. A.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063783409070075.pdf

Reference9 articles.

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3. M. H. Lente, A. Picinin, J. P. Rino, and J. A. Eiras, J. Appl. Phys. 95, 2646 (2004).

4. A. S. Sidorkin, L. P. Nesterenko, I. A. Bocharova, G. L. Smirnov, and S. V. Ryabtsev, Izv. Akad. Nauk, Ser. Fiz. 68(7), 994 (2004).

5. M. D. Glinchuk and A. N. Morozovska, J. Phys.: Condens. Matter 16, 3517 (2004).

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