Effect of mechanical stresses on the dielectric response of PZT ferroelectric thin films-Reference-Cited by-同舟云学术

Effect of mechanical stresses on the dielectric response of PZT ferroelectric thin films

Published:2006-06 Issue:6 Volume:48 Page:1179-1181
ISSN:1063-7834
Container-title:Physics of the Solid State
language:en
Short-container-title:Phys. Solid State

Author:

Laletin R. A.,Burkhanov A. I.,Zhoga L. V.,Shil’nikov A. V.,Sigov A. S.,Vorotilov K. A.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063783406060515.pdf

Reference5 articles.

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4. Youngsung Kim, Wangkyu Lim, and Jaichan Lee, Integr. Ferroelectr. 37, 285 (2001).

5. L. I. Solov’eva, I. E. Obvintseva, M. I. Yanovskaya, K. A. Vorotilov, and V. A. Vasil’ev, Neorg. Mater. 32(7), 866 (1996) [Inorg. Mater. 32 (7), 767 (1996)].

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