1. Springer Handbook of Nanotechnology, Ed. by B. Bhushan (Springer-Verlag, Berlin, 2004).
2. V. S. Vavilov, V. F. Kiselev, and B. N. Mukashev, Defects in the Bulk and on the Surface of Silicon (Nauka, Moscow, 1990), p. 212 [in Russian].
3. J. Lalita, B. G. Svensson, C. Jagadish, and A. Hallén, Nucl. Instrum. Methods Phys. Res., Sect. B 127/128, 69 (1997).
4. G. Golan, E. Rabinovich, A. Inberg, A. Axelevich, M. Oksman, Y. Rosenwaks, A. Kozlovsky, P. G. Rancoita, M. Rattaggi, A. Seidman, and N. Croitoru, Microelectron. Reliab. 39, 1497 (1999).
5. Yu. I. Golovin, A. A. Dmitrievskiĭ, and N. Yu. Suchkova, Fiz. Tverd. Tela (St. Petersburg) 48(2), 262 (2006) [Phys. Solid State 48 (2), 279 (2006)].