Analysis of structural transformations and fluctuation effects in the nanosized nickel films in the vicinity of the melting point-Reference-Cited by-同舟云学术

Analysis of structural transformations and fluctuation effects in the nanosized nickel films in the vicinity of the melting point

Published:2012-06 Issue:6 Volume:57 Page:629-633
ISSN:1064-2269
Container-title:Journal of Communications Technology and Electronics
language:en
Short-container-title:J. Commun. Technol. Electron.

Author:

Golik R. G.,Gromov D. G.,Zhigal’skii G. P.

Publisher

Pleiades Publishing Ltd

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1064226912030072.pdf

Reference8 articles.

1. Yu. F. Komnik, Physics of Metal Films (Atomizdat, Moscow, 1979) [in Russian].

2. G. P. Zhigal’skii and B. K. Jones, The Physical Properties of Thin Metal Films. Textbook (Taylor and Francis Publishing Group, London, 2003).

3. D. G. Gromov, S. A. Gavrilov, E. N. Redichev, et al., Zh. Fiz. Khim. 80, 1856 (2006).

4. S. A. Gavrilov, D. G. Gromov, G. P. Zhigal’skii, et al., in Fluctuation and Degradation Processes in Semiconductor Devices (Proc. Int. Sci.-Method. Seminar, Moscow, 2009) (MNTORES im. A. S. Popova., Moscow, 2009), p. 70 [in Russian].

5. R. G. Golik, D. G. Gromov, and G. P. Zhigal’skii, in Fluctuation and Degradation Processes in Semiconductor Devices (Proc. Int. Sci.-Method. Seminar, Moscow, 2009) (MNTORES im. A. S. Popova., Moscow, 2010), p. 71 [in Russian].

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