Kinetics of point defects and amorphization in thin films under irradiation-Reference-Cited by-同舟云学术

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Kinetics of point defects and amorphization in thin films under irradiation

Published:2003-09 Issue:9 Volume:45 Page:1679-1682
ISSN:1063-7834
Container-title:Physics of the Solid State
language:en
Short-container-title:Phys. Solid State

Author:

Ovid’ko I. A.,Reizis A. B.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/1.1611233.pdf

Reference21 articles.

1. H. Abe, Sh. Yamamoto, and H. Naramoto, Nucl. Instrum. Methods Phys. Res. B 127/128, 170 (1997).

2. V. A. Skuratov, A. E. Efimov, and D. L. Zagorskii, Fiz. Tverd. Tela (St. Petersburg) 44(1), 165 (2002) [Phys. Solid State 44, 171 (2002)].

3. V. R. Galakhov, D. A. Zatsepin, L. V. Elokhina, et al., Fiz. Tverd. Tela (St. Petersburg) 44(7), 1318 (2002) [Phys. Solid State 44, 1380 (2002)].

4. F. Banhart, Fiz. Tverd. Tela (St. Petersburg) 44(3), 388 (2002) [Phys. Solid State 44, 399 (2002)].

5. D. Pacifici, E. C. Moriera, G. Franzo, et al., Phys. Rev. B 65(14), 144109 (2002).

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