1. Kirovskaya, I.A., Fiziko-khimicheskie svoistva binarnykh i mnogokomponentnykh almazopodobnykh poluprovodnikov (Physical and Chemical Properties of Binary and Multicomponent Diamond-Like Semiconductors), Novosibirsk: Sib. Branch Russ. Acad. Sci., 2015.
2. Morozov, V.N. and Chernov, V.G., Phase equilibria in the InAs–CdTe system, Izv. Akad. Nauk, Ser. Khim., 1979, no. 8, pp. 1324–1329.
3. Gorelik, S.S., Rastorguev, L.N., and Skakov, Yu.A., Rentgenograficheskii i elektronnoopticheskii analiz (X-Ray and Electron-Optical Analysis), Moscow: Metallurgiya, 1970.
4. Smyslov, E.F., Express X-ray method of nanocrystal materials lattice parameter determination, Zavod. Lab. Diagn. Mater., 2006, vol. 72, no. 5, pp. 33–35.
5. Clarke, A.R. and Eberhardt, C.N., Microscopy Techniques for Materials Science, Cambridge: Woodhead, 2002.