1. A. A. Lomov, V. A. Bushuev, V. A. Karavanski, and S. Bayliss, Crystallogr. Rep. 48, 326 (2003).
2. D. K. Bowen and B. K. Tanner, High-Resolution X-Ray Diffractometry and Topography (Taylor Francis, London, 2005).
3. N. V. Marchenkov, A. G. Kulikov, and I. I. Atknin, Phys. Uspekhi 189, 187 (2019).
4. Ya. A. Eliovich, V. I. Akkuratov, A. V. Targonskii, et al., Crystallogr. Rep. 63, 716 (2018).
5. H. Kim, S. J. Gotoh, T. Takahashi, et al., Nucl. Instrum. Methods Phys. Res., Sect. A 246, 810 (1986).