Two-photon confocal microscopy as a tool for nonequilibrium charge-carrier lifetime tomography in semiconductor materials-Reference-Cited by-同舟云学术

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Two-photon confocal microscopy as a tool for nonequilibrium charge-carrier lifetime tomography in semiconductor materials

Published:2016-12 Issue:11 Volume:104 Page:754-758
ISSN:0021-3640
Container-title:JETP Letters
language:en
Short-container-title:Jetp Lett.

Author:

Kalinushkin V. P.,Uvarov O. V.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S0021364016230089.pdf

Reference7 articles.

1. T. Wilson, in Confocal and Two-Photon Microscopy: Foundations, Applications and Advances (Wiley–Liss, New York, 2002), p.19.

2. A. Diaspro and C. Sheppard, in Confocal and Two-Photon Microscopy: Foundations, Applications and Advances (Wiley–Liss, New York, 2002), p.39.

3. J. Jonkman and E. Stelzer, in Confocal and Two-Photon Microscopy: Foundations, Applications and Advances (Wiley–Liss, New York, 2002), p.101.

4. D. D. Nedeoglo and A. V. Simashkevich, Electrical and Luminescent Properties of Zinc Selenide (Shtiintsa, Kishinev, 1984) [in Russian].

5. A. S. M. Noor, A. Miyakwa, Y. Kawata, and M. Torizawa, Appl. Phys. Lett. 92, 116106 (2008).

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