Characterization of ZnO Thin-film Transistors with Various Active Layer Structures after Exposure to Different Proton Energies
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Published:2024-04-30
Issue:2
Volume:24
Page:63-68
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ISSN:2233-4866
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Kim Yu-Mi,Park Jun-Kue,Ko Woon-San,Kim Ki-Nam,Lee Ga-Won
Publisher
The Institute of Electronics Engineers of Korea