Quantitative Analysis of Channel Width Effects on Electrical Performance Degradation of Top-gate Self-aligned Coplanar IGZO Thin-film Transistors under Self-heating Stresses
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Published:2023-02-28
Issue:1
Volume:23
Page:79-87
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ISSN:1598-1657
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Lee Dong-Ho,Jeong Hwan-Seok,Kim Yeong-Gil,Kim Myeong-Ho,Son Kyoung-Seok,Lim Jun-Hyung,Song Sang-Hun,Kwon Hyuck-In
Publisher
The Institute of Electronics Engineers of Korea
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials