High-speed Clock and Data Recovery System with Segmented Slew-rate Control Circuit for High-linearity in 65 nm CMOS Process
-
Published:2021-06-30
Issue:3
Volume:21
Page:199-205
-
ISSN:1598-1657
-
Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
-
language:en
-
Short-container-title:JSTS
Author:
Min Kyunghwan,Lee Sanggeun,Oh Taehyoun
Publisher
The Institute of Electronics Engineers of Korea
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials