Empirical Analysis of Disaggregated Cloud Memory on Memory Intensive Applications
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Published:2023-10-31
Issue:5
Volume:23
Page:273-282
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ISSN:2233-4866
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Jeong Yeonwoo,Jung Gyeonghwan,Park Kyuli,Kim Youngjae,Park Sungyong
Publisher
The Institute of Electronics Engineers of Korea
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials