Resistance Characteristics of Thin Films and Contacts in CMOS under Cryogenic Temperature and High Magnetic Field Environment
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Published:2024-04-30
Issue:2
Volume:24
Page:122-127
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ISSN:2233-4866
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Shim Dongha,Kim Deokgi
Publisher
The Institute of Electronics Engineers of Korea