Analysis of Cell Current with Abnormal Channel Profile in 3D NAND Flash Memory
-
Published:2024-04-30
Issue:2
Volume:24
Page:138-143
-
ISSN:2233-4866
-
Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
-
language:en
-
Short-container-title:JSTS
Author:
Lee Jaewoo,Kim Yungjun,Shin Yoocheol,Park Seongjo,Kang Daewoong,Kang Myounggon
Publisher
The Institute of Electronics Engineers of Korea