Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins
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Published:2019-08-31
Issue:4
Volume:19
Page:388-395
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ISSN:1598-1657
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Lee Kiseok,Li Tan,Baeg Sanghyeon
Publisher
The Institute of Electronics Engineers of Korea
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials