Single and multiple diffraction in non-absorbing perfect crystal spheres bathed in the monochromatic parallel incident beam: The intensity pattern of ψ-scans calculated in the framework of the kinematical approach

Abstract

Abstract Expressions for the calculation of multiple diffraction patterns for perfect crystals spheres are given in the kinematical approach. Two experimental ψ-scans of the ‘almost forbidden’ 222 reflection of silicon, measured with AgKα -radiation and with synchrotron radiation at λ = 0.5612 Å, are compared with simulations performed with the program UMWEG-97. It is shown that multiple diffraction patterns of perfect spherical crystal samples can be satisfactorily predicted on absolute scale.