TexPat – a program for quantitative analysis of oblique texture electron diffraction patterns

Abstract

Abstract We have developed a program – TexPat for quantification of texture patterns in order to facilitate, speed up and improve the accuracy of this analytical method. The program introduces new approaches for automated detection of centre and symmetry axes and simplifies the process of indexing and calculating the unit cell parameters. The main algorithm of the program uses the symmetry properties of the texture pattern images. The successive steps help to process the reflections of the pattern using the peak shape extracted from well-separated peaks. The program generates a list of unit cell parameters, all processed reflections with Miller indices and their integrated intensities. The quality of the results obtained by TexPat is compatible with published data.