Affiliation:
1. Universität Erlangen-Nürnberg, Lehrstuhl für Qualitätsmanagement und Fertigungste, Erlangen, Deutschland
Abstract
Abstract
Since the development of X-ray Computed Tomography (CT) and its rapid acceptance in medical diagnostics, it became not only a powerful tool for non-destructive testing but was also adopted in manufacturing metrology in the last decade. CT offers new possibilities for coordinate measurements as it is possible to acquire a volumetric model of the entire workpiece with a single measurement at which analyses known from coordinate metrology such as estimation of geometric features or nominal/actual value comparisons can be performed. But with data sets generated by tomographic measurements it is as well possible to analyze the entire volume of the workpiece, so detection and analysis of conventionally not accessible features like defects (flaws, blow holes, bubbles) or wall thickness analyses with uncertainties in the micrometer range are possible.
Subject
Electrical and Electronic Engineering,Instrumentation
Cited by
7 articles.
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