Applications of thin layer activation technique for the measurement of surface loss of materials: an Indian perspective

Author:

Chowdhury D. P.,Datta J.1,Reddy A. V. R.2

Affiliation:

1. Bhaba Atomic Research Centre, Analytical Chemistry Division, Kolkata - 700064, Indien

2. Bhabha Atomic Research Centre, Analytical Chemistry Division, Trombay, Mumbai - 400085, Indien

Abstract

Abstract Thin layer activation (TLA) technique is a powerful nuclear technique based on the production of a radioisotope in the surface of a material by a charged particle induced nuclear reaction, followed by an estimation of the loss of the activity which is a measure of the surface loss of materials in the range of nanometer to hundreds of micrometer in the fields of wear, corrosion or erosion. The technique has been found to be a very useful tool in the basic scientific research and industrial applications. The present review describes the basic principle of TLA technique, its characteristic features, methodology, scope, applications and various recent developments regarding its growing use. Some of our earlier TLA work carried out with α and heavy ion (16O) in various applied areas is also included here. Heavy ions were used because no other light ions (particularly protons) were available at our cyclotron.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry

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