Abstract
Abstract
A method for measuring piezoelectric constants by a dynamic method operating at frequencies of about 3 – 5kHz is described. It is characterized by simple handling and evaluation of the piezoelectric constants dijk
and their sign, high accuracy (<1%) and the possibility of piezoelectric measurements on semiinsulating (ϱ ≥ 109
Ω cm) crystals. The method is based on the inverse piezoelectric effect. The piezoelectrically induced deformation of the test crystal is detected by a piezoelectric ceramic and compared with that of a standard crystal (α-quartz). Piezoelectric coefficients of some substances are redetermined. Values for the dijk
of CdTe and N2H5LiSO4 are given.
Subject
Inorganic Chemistry,Condensed Matter Physics,General Materials Science
Cited by
4 articles.
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