1. I leave these references uncited. My intent is not to point a finger or to embarrass anyone. Rather, I am trying to raise the awareness of the oxide TFT community to the possibility of electrical-assessment measurement artifacts.
2. An excellent electrical characterization reference, although geared to MOSFETs rather than TFTs, is D. K. Schroder,Semiconductor Material and Device Characterization, 3rd edn. (Wiley-Interscience, Hoboken, New Jersey, 2006).
3. Electrical Characterization Of MIS Interfaces
4. The effects of oxide traps on the MOS capacitance
5. Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors