57.4: The Effect of the Roughness of the Glass Substrate on the Roughness of the Barrier Layer Used During Fabrication of Poly-Si TFTs-Reference-Cited by-同舟云学术

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57.4: The Effect of the Roughness of the Glass Substrate on the Roughness of the Barrier Layer Used During Fabrication of Poly-Si TFTs

Published:2003 Issue:1 Volume:34 Page:1516
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest

Author:

Shah Himanshu C.,Davis Ronald W.

Publisher

Wiley

Reference7 articles.

1. Nanostructural characterization of thin‐film transistors using a combination of scanning force microscopy and transmission electron microscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fabrication Process;Short-Channel Organic Thin-Film Transistors;2015

2. Organic Thin-Film Transistors;Short-Channel Organic Thin-Film Transistors;2015

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