35.3: Exo-electron Measurements in AC-PDPs with Exposed Address-Electrode Structure-Reference-Cited by-同舟云学术

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35.3: Exo-electron Measurements in AC-PDPs with Exposed Address-Electrode Structure

Published:2010 Issue:1 Volume:41 Page:511
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest

Author:

Awaji Noriyuki,Tolner Harm,Zhao Lingguo,Jiang Jue,Kajiyama Hiroshi

Publisher

Wiley

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1889/1.3500510/fullpdf

Reference4 articles.

1. Harm Tolner, Xiaoyun Zhang, Chengli Wang, Zhihu Liang, Chun Liang Liu, Shengli Wu, Noriyuki Awaji, and Hiroshi Kajiyama, “Exoemission Properties of Oxide Protective Layers in a PDP,” Proc. Euro-display'09, 475–477, (2009).

2. Dual-plate OLED display (DOD) based on amorphous-silicon (a-Si) TFT backplane

3. Private communication with Prof. Shengli Wu, on Feb. 19th 2009 in Hiroshima Univ.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 37.1: Invited Paper: Surface Electronic States of MgO Induced by Auger Neutralization Process;SID Symposium Digest of Technical Papers;2011-06

2. 35.2: Invited Paper: A Consideration of Excitation and De-excitation Process of MgO Protective Layer;SID Symposium Digest of Technical Papers;2010

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