Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons-Reference-Cited by-同舟云学术

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Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons

Published:2008-02-15 Issue:7 Volume:77 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Hibino H.,Kageshima H.,Maeda F.,Nagase M.,Kobayashi Y.,Yamaguchi H.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.77.075413/fulltext

Reference45 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Two-dimensional gas of massless Dirac fermions in graphene

3. Experimental observation of the quantum Hall effect and Berry's phase in graphene

4. Patterning of highly oriented pyrolytic graphite by oxygen plasma etching

5. LEED and Auger electron observations of the SiC(0001) surface

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