Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.62.13667/fulltext
Reference21 articles.
1. Atomic Force Microscope
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3. Contact of characterised metal surfaces at very low loads: Deformation and adhesion
4. Observation of single charge carriers by force microscopy
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