Fundamental inversion problem for the magnetic-force microscopy of superconductors
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.11648/fulltext
Reference31 articles.
1. Lateral resolution in magnetic force microscopy. Application to periodic structures
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5. Magnetic force microscopy signal of flux line above a semi-infinite type II-superconductor
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