Correlation effects in valence-band spectra of nickel silicides
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.30.5696/fulltext
Reference31 articles.
1. XPS study of the chemical structure of the nickel/silicon interface
2. Chemical bonding and electronic structure ofPd2Si
3. Electronic structure of compounds at platinum - silicon (111) interface
4. Nature of the valence states in silicon transition metal interfaces
5. Chemical bonding and reactions at the Pd/Si interface
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