Resonant tunneling in the presence of a two-level fluctuator: Low-frequency noise
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.52.12126/fulltext
Reference17 articles.
1. Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (1f?) Noise
2. Composition of1fNoise in Metal-Insulator-Metal Tunnel Junctions
3. Defect Interactions and Noise in Metallic Nanoconstrictions
4. Resonant tunneling in the presence of a two-level fluctuator: Average transparency
5. Inelastic scattering in resonant tunneling
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