Medium-energy electron diffraction from Cu(100)
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.1743/fulltext
Reference19 articles.
1. X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography
2. Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy
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