Diffraction imaging: The limits of partial coherence-Reference-Cited by-同舟云学术

Diffraction imaging: The limits of partial coherence

Published:2012-12-03 Issue:23 Volume:86 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Chen Bo,Abbey Brian,Dilanian Ruben,Balaur Eugeniu,van Riessen Grant,Junker Mark,Tran Chanh Q.,Jones Michael W. M.,Peele Andrew G.,McNulty Ian,Vine David J.,Putkunz Corey T.,Quiney Harry M.,Nugent Keith A.

Funder

U.S. Department of Energy

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.86.235401/fulltext

Reference33 articles.

1. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens

2. Coherent lensless X-ray imaging

3. Coherent methods in the X-ray sciences

4. Coherent X-ray diffraction imaging of strain at the nanoscale

5. Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities

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