Soft-x-ray-emission studies of bulkFe3Si, FeSi, andFeSi2, and implanted iron silicides
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.9446/fulltext
Reference20 articles.
1. The structure and properties of metal-semiconductor interfaces
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4. d and f metal interface formation on silicon
5. Mechanism of Electrical Conduction in β-FeSi2
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