Analysis of photoemission in amorphousSiOxandSiNxalloys in terms of a charge-transfer model
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.12478/fulltext
Reference27 articles.
1. Amorphous silicon‐silicon nitride thin‐film transistors
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4. Reactive Plasma Deposited Si‐N Films for MOS‐LSI Passivation
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