Impedance spectroscopy of multiferroicPbZrxTi1−xO3∕CoFe2O4layered thin films-Reference-Cited by-同舟云学术

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Impedance spectroscopy of multiferroicPbZrxTi1−xO3∕CoFe2O4layered thin films

Published:2008-01-28 Issue:1 Volume:77 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Ortega N.,Kumar Ashok,Bhattacharya P.,Majumder S. B.,Katiyar R. S.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.77.014111/fulltext

Reference36 articles.

1. Applications of Modern Ferroelectrics

2. The Renaissance of Magnetoelectric Multiferroics

3. Exploration of artificial multiferroic thin-film heterostructures using composition spreads

4. Magnetoelectric CoFe2O4∕Pb(Zr0.52Ti0.48)O3 double-layer thin film prepared by pulsed-laser deposition

5. The role of ferroelectric-ferromagnetic layers on the properties of superlattice-based multiferroics

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