Carrier propagation in sputtereda-Si:H
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.25.5373/fulltext
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1. Temperature dependence of electron mobility in Bi12GeO20 and Bi12SiO20 using the time-of-flight technique;Journal of Applied Physics;1997-07
2. Dispersive electron transport in polycrystalline films of CdTe;Physical Review B;1993-07-15
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